CRAIC Technologies specializes in UV-visible-NIR range micro-analysis. |
CRAIC Technologies™ specializes in developing superior UV-visible-NIR microanalysis solutions: we build instrument to collect spectra and images of sample features ranging from sub-micron to hundreds of microns. CRAIC Technologies products include UV and NIR microscopes, UV-visible-NIR microspectrophotometers, instruments to measure thin film thickness and colorimetry on the microscopic scale, Raman microspectrometers, automation solutions, traceable standards and more.
WHAT WE DO
20/30 PV™ UV-Visible-NIR Microspectrophotometer
The 20/30 PV™: custom built to give you superior UV-visible-NIR spectra and images of microscopic samples. |
The innovative 20/30 PV™ microspectrophotometer is the latest and most powerful instrument from CRAIC Technologies. Built to meet your requirements, this bespoke instrument incorporates the latest technological advances in optics, spectroscopy and software to deliver the superior performance with unparalleled speed and capabilities. The ease-of-use for which CRAIC instruments are known has even been improved, making this instrument the cutting edge of UV-visible-NIR microspectroscopy.
The 20/30 PV™ microspectrophotometer combines the latest technologies to allow the user to measure UV-visible-NIR range transmission, absorbance, reflectance, emission and fluorescence spectra of sample areas smaller than a micron across. Even the thickness of thin films and color spaces may be determined. And while microspectra™ are being acquired, the sample may be viewed with high-resolution digital imaging in the deep UV, in color or in the near infrared. Ease of use features also add to the power of the 20/30 PV™ system and include everything from improvements in the instruments ergonomics to software to automation.
The 20/30 PV™ microspectrophotometer is simple to use, the measurements are non-destructive and the spectral data is unmatched.
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Cutting edge microspectroscopy from the leaders
A fully integrated microspectroscopy unit that features a spectral range from the deep UV through the visible and into the near infrared. Simultaneous and direct imaging of both the sampling aperture and the sample makes for fast, accurate measurements. Featuring Lightblades™ technology, the 20/30 PV™ gives you the ability to measure transmission, reflectance, polarization and fluorescence spectra of even sub-micron samples.
CRAIC Technologies is also the only recognized source for NIST traceable microspectrometer standards. |
Flexible Raman Microspectroscopy
When fitted with the CRAIC Apollo™ Raman spectrometer module, the 20/30 PV™ is capable of Raman, resonance Raman and other types of measurements of microscopic samples. Modules include lasers, Raman spectrometers and the interface optics that allow you to collect high quality Raman spectra of your samples. |
Cutting edge microspectroscopy from the leaders
The 20/30 PV™ can be configured for fluorescence and luminescence spectra andimages of microscopic samples. Featuring Lightblades™ technology and with excitation ranging from the deep UV to the near infrared and the ability to measure the emission in the same range, the 20/30 PV™ is a powerful tool for microfluorometry for materials sciences, biology, geology and more. |
Microspectroscopy & imaging of UV-visible-NIR polarization
20/30 PV™ can be configured to acquire the polarization spectra and images of even the smallest samples. Featuring Lightblades™ technology and with a spectral range from the UV to the NIR, the 20/30 PV™ polarization microspectroscopy capabilities are unparalleled. The spectra and images of birefringent and other types of samples with polarization characteristics can be acquired quickly and easily with this sophisticated system. |
Spectral Surface Mapping™
Combines hardware and software for automated spectral analysis and 3D mapping of samples with microscopic spatial resolution. 3D maps of the absorbance, transmission, reflectance, fluorescence, emission and Raman spectra of samples may be generated. |
Superior image quality from the UV to the NIR
Applications
- Semiconductor Film Thickness
- MEMS devices
- Surface Plasmon Resonance
- Photonic Bandgap Crystals
- Process Impurity Detection
- Protein Crystals
- Forensic Science
- Drug Chemistry
- Questioned Documents
- OLED’s
- Flat Panel Color Masks
- Combinatorial Chemistry
20/30 PV™ UV-Visible-NIR Microspectrophotometer sistemi ile ilgili daha fazla bilgi için tıklayınız.
The innovative 20/30 XL™ microspectrophotometer is designed to allow you to acquire spectra, images, and film thickness measurements of microscopic features of large scale samples. “XL” stands for “extra large” and these are the types of samples for which this instrument was built. Built to meet your needs, the bespoke 20/30 XL™ incorporates the latest technological advances in optics, spectroscopy and software to deliver the superior performance with unparalleled speed and capabilities. The ease-of-use for which CRAIC instruments are known has even been improved, making this instrument the cutting edge of UV-visible-NIR microspectroscopy.
The 20/30 XL™ microspectrophotometer allows you to measure UV-visible-NIR range transmission,absorbance, reflectance, emission and fluorescence spectra of features smaller than a micron across. Yet, depending upon the instrument configuration, the size of the sample can essentially be unlimited. Now you can map color varations within pixels of the biggest flat panel displays, measure film thickness of 300 mm wafers with ease or measure the fluorescence of the largest artworks.
Raman microspectroscopy, high resolution UV microscopy and even NIR microscopy are also offered.
The 20/30 XL™ microspectrophotometer is simple to use, the measurements are non-destructive and the spectral data is unmatched.
- Microspot analysis of very large scale samples
- Spectral Range: 200 to 2100 nm
- UV-visible-NIR transmission microspectroscopy
- UV-visible-NIR transmission imaging
- UV-visible-NIR reflectance microspectroscopy
- UV-visible-NIR reflectance imaging
- UV-visible-NIR fluorescence microspectroscopy
- UV-visible-NIR fluorescence micro-imaging
- Raman microspectroscopy
- Polarization microspectroscopy in the UV, visible and NIR regions.
- Polarization microscale imaging in the UV, visible and NIR regions
- Thin film thickness measurements
- Colorimetry of microscopic samples.
- Refractive index measurements with the rIQ™ package.
- Featuring Lightblades™ technology
- Manual or fully automated operation
- Integrated TE cooled array detectors for low noise and long term stability
- Precision temperature control of samples
- Calibrated, variable measurement areas even smaller than a micron
- Superior images both with eyepieces and digital imaging
- Featured with Lambdafire™ spectroscopy and imaging control and analysis software. Lambdafire™ also includes touchscreen control.
- Specialized software including statistical analysis, spectral databasing, image analysis and more
- Easy to use and maintain
- From the experts in microspectroscopy
Cutting edge microspectroscopy from the leaders
A fully integrated microspectroscopy unit that features a spectral range from the deep UV through the visible and into the near infrared. Simultaneous and direct imaging of both the sampling aperture and the sample makes for fast, accurate measurements. Featuring Lightblades™ technology, the 20/30 XL™ gives you the ability to measure transmission, reflectance, polarization and fluorescence spectra of even sub-micron samples.
CRAIC Technologies is also the only recognized source for NIST traceable microspectrometer standards. |
Flexible Raman Microspectroscopy
When fitted with the CRAIC Apollo™ Raman spectrometer module, the 20/30 XL™ is capable of Raman, resonance Raman and other types of measurements of microscopic samples. Modules include lasers, Raman spectrometers and the interface optics that allow you to collect high quality Raman spectra of your samples. |
Cutting edge microspectroscopy from the leaders
The 20/30 XL™ can be configured for fluorescence and luminescence spectra andimages of microscopic samples. Featuring Lightblades™ technology and with excitation ranging from the deep UV to the near infrared and the ability to measure the emission in the same range, the 20/30 XL™ is a powerful tool for microfluorometry for materials sciences, biology, geology and more. |
Microspectroscopy & imaging of UV-visible-NIR polarization
20/30 XL™ can be configured to acquire the polarization spectra and images of even the smallest samples. Featuring Lightblades™ technology and with a spectral range from the UV to the NIR, the 20/30 XL™ polarization microspectroscopy capabilities are unparalleled. The spectra and images of birefringent and other types of samples with polarization characteristics can be acquired quickly and easily with this sophisticated system. |
Spectral Surface Mapping™
Combines hardware and software for automated spectral analysis and 3D mapping of samples with microscopic spatial resolution. 3D maps of the absorbance, transmission, reflectance, fluorescence, emission and Raman spectra of samples may be generated. |
Superior image quality from the UV to the NIR
Applications
- Semiconductor Film Thickness
- MEMS devices
- Colorimetry of flat panel displays
- Intensity mapping of flat panel displays
- Spectra of Questioned Documents
- or any other large scale samples…
20/30 XL™ UV-Visible-NIR Microspectrophotometer sistemi ile ilgili daha fazla bilgi için tıklayınız.
FLEX™ from CRAIC is a full-featured yet flexibly configured instrument that incorporates UV-visible-NIRoptics, spectrophotometers digital imaging, and software…all tied together with our Lightswitch by CRAIC™optical multiplexer. With our Lightswitch by CRAIC™ technology, FLEX™ retains the ease-of-use for whichCRAIC instruments are known, while being capable of everything from UV-visible-NIR microspectroscopy, high resolution microscopic imaging, refractive index measurements and more.
With an attractive price-entry point, the FLEX™ microspectrophotometer utilizes tested technologies to allow you to measure UV-visible-NIR range transmission, absorbance, reflectance, emission and fluorescence spectra of microscopic sample areas. And while microspectra™ are being acquired, the sample may be simultaneously imaged with a high-resolution color digital imaging system or through eyepieces. Additional features may also include measuring the refractive index of microscopic samples as well asmicrocolorimetry and microspot thin film thickness measurements.
The FLEX™ microspectrophotometer is built to yield superior quality images and spectra for an attractive price.
- UV-visible-NIR microspectroscopy
- UV-visible-NIR imaging
- Transmission, reflectance, polarization and fluorescence microspectroscopy
- Transmission, reflectance, polarization and fluorescence microimaging
- Raman microspectroscopy
- Thin film thickness measurements
- Colorimetry of microscopic samples.
- Refractive index measurements with the rIQ™ package.
- Featuring Lightblades™ technology
- Integrated TE cooled array detectors available for low noise and long term stability
- Calibrated, variable measurement areas smaller than a micron available
- Featured with Lambdafire™ spectroscopy and imaging control and analysis software.
- Superior images both with eyepieces and digital imaging
- Specialized software including statistical analysis, spectral databasing, image analysis and more
- Easy to use and maintain
- From the experts in microspectroscopy
Cost effective microspectroscopy
Microspectroscopy that features a spectral range from the UV through the visible and into the near infrared. Simultaneous and direct imaging of both the sampling aperture and the sample makes for fast, accurate measurements. Featuring Lightblades™ technology, the FLEX™ gives you the ability to measure transmission, reflectance and fluorescence spectra of even sub-micron samples.
CRAIC Technologies is also the only recognized source for NIST traceable microspectrometer standards. |
Flexible Raman Microspectroscopy
When fitted with the CRAIC Apollo™ Raman spectrometer module, the FLEX™ is capable of Raman, resonance Raman and other types of measurements of microscopic samples. Modules include lasers, Raman spectrometers and the interface optics that allow you to collect high quality Raman spectra of your samples. |
High sensitivity microfluorometry & imaging
The FLEX™ can be configured for fluorescence and luminescence spectra andimages of microscopic samples. Featuring Lightblades™ technology and with excitation ranging from the deep UV to the near infrared and the ability to measure the emission in the same range, the FLEX™ is a powerful tool for microfluorometry for materials sciences, biology, geology and more. |
Spectral Surface Mapping™
Combines hardware and software for automated spectral analysis and 3D mapping of samples with microscopic spatial resolution. 3D maps of the absorbance, transmission, reflectance, fluorescence, emission and Raman spectra of samples may be generated. |
Superior image quality from the UV to the NIR
Applications
- Trace Evidence
- Forensic Drug Chemistry
- Questioned Documents
- OLED’s
- Flat Panel Color Masks
- Semiconductor Film Thickness
- MEMS devices
- Surface Plasmon Resonance
- Photonic Bandgap Crystals
- Process Impurity Detection
- Protein Crystals
- Combinatorial Chemistry
FLEX™ UV-Visible-NIR Microspectrophotometer sistemi ile ilgili daha fazla bilgi için tıklayınız.
TheCRAIC Apollo™ Raman spectrometer is designed for fast, easy micro-Raman spectroscopy so you can focus on sample measurements and results, not instrument setup. As such, it is perfect for routine research, quality control and failure analysis. The CRAIC Apollo™ Raman spectrometer employs optics, software and hardware all optimized for Raman spectroscopy of microscopic samples. The CRAIC Apollo™ Raman spectrometer is perfect for rapid, non-destructive analysis in fields such as life sciences, materials science, chemistry and physics.
The CRAIC Apollo™ Raman microspectrometer features a modular design. Each module includes laser excitation, optical interface, Raman spectrometer and software. Modules are offered with different lasers wavelengths and can be used together for the ultimate in experimental flexibility.
With an all solid state design, The CRAIC Apollo™ Raman microspectrometer is able to measure Raman scattering from microscopic samples quickly, easily and non-destructively. This Raman system is durable, easy to use, highly sensitive and economical to own and operate.
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More capabilities when combined with other CRAIC Instruments:
- Thin film thickness measurements.
- Refractive index measurements with the rIQ™ package.
- Colorimetry of microscopic samples.
- Traceable spectroscopy standards designed for microspectrophotometers
- Manual or fully automated operation
- Precision temperature control of samples
- Specialized software including statistical analysis, spectral databasing, image analysis and more
Spectral Surface Mapping™
Combines hardware and software for automated spectral analysis and 3D mapping of samples with microscopic spatial resolution. 3D maps of the absorbance, transmission, reflectance, fluorescence, emission and Raman spectra of samples may be generated. |
Applications
- Life Sciences
- Flat Panel Displays
- Semiconductor Metrology
- Biotechnology Development
- Process Impurity Detection
- Biological Research
- MEMS devices
- WMD Detection
CRAIC Apollo™ Raman Spectrometer sistemi ile ilgili daha fazla bilgi için tıklayınız.
The CRAIC MP-2™ Microscope Photometer is designed to add photometry and imaging to your optical microscope. Actually, the CRAIC MP-2™ is better described as a microscope radiometer in that it has a spectral range from the deep UV to the near infrared. It is limited only by the microscope itself.
The CRAIC MP-2™ microphotometer attaches to your microscope and enables you to collect transmission, reflectance or even fluorescence and luminescence photometric data of microscopic samples. The solid state detectors have dynamic ranges and sensitivities greater than PMTs or imaging systems. With complete software control, either broad- or narrow-band photometric intensity measurements can be made. Additionally, with the use of CRAIC reference materials, precise photometric intensities can be recorded relative to the reference material. With the CRAIC MP-2™ microphotometer, high quality photometry of even sub-micron samples can be done quickly, non-destructively and easily.
- Sensitive detector for low noise and long term stability
- Total spectral range from deep UV to NIR with the specific range selected by the user
- Rapid radiometric measurement capabilities
- High dynamic range & high sensitivity
- High spatial resolution & stray light resistance
- Variable measurement areas down to sub-micron
- Also incorporates high resolution digital imaging…up to 6 megapixels
More capabilities…
- Traceable spectroscopy standards designed for microspectrophotometers
- Manual or fully automated operation
- Precision temperature control of samples
- Specialized software including statistical analysis, spectral databasing, image analysis and more
Spectral Surface Mapping™
Combines hardware and software for automated spectral analysis and 3D mapping of samples with microscopic spatial resolution. 3D maps of the absorbance, transmission, reflectance, fluorescence, emission and Raman spectra of samples may be generated. |
Applications
- Immunohistochemistry
- Cytophotometry
- Immunofluorescence
- Cytofluorimetry
- Intracellular calcium measurements
- DNA analysis
- Thickness measurements
- Ion and pH measurements
- Mineralogy
- Densitometry
- Vitrinite reflectance
- Photoreceptor analysis
- Gemology
CRAIC MP-2™ Microscope Photometer sistemi ile ilgili daha fazla bilgi için tıklayınız.
The CoalPro III™ Optical Petrography System from CRAIC Technologies is a microphotometer designed for the organic petrographic analysis using Standard Test Methodologies ISO 7404-5 and ASTM D2798. Thismicrophotometer is configured to measure the reflectance from coals, kerogens and petroleum source rock. However, it also has a very flexible design. The CoalPro III™ was developed anticipating the next generation of test protocols as well as for fluorescence and micro-imaging.
Incorporating a new optical detector and CRAIC CoalPro™ software, the CoalPro III™ system grades the energy content of coals, kerogens and petroleum source rock using the ISO 7404 and ASTM D2798standard test methods. It also gives you the ability to collect full color images of each measurement location in addition to full automation if desired.
However, the CoalPro III™ can also be upgraded to a full 308 Coal™ microscope spectrophotometer to measure the full reflectance spectrum and the spectral fluorescence from coal, kerogen, petroleum source rock and other petrochemicals.
With no moving parts, the CoalPro III™ is durable and user friendly. Designed with flexibility and speed in mind, the CoalPro III™ system rapidly measures vitrinite reflectivity and also has the ability to do other types of spectroscopic and petrographic analysis and imaging. With this flexibility of design, it will easily comply with future changes in coal testing methods and your own experiments.
- High sensitivity detector with low noise and long term stability
- CRAIC CoalPro™ software to calculate reflectance per ISO 7404 and ASTM D2798 standard test methods.
- CRAIC Vitrinite Reference Materials available
- Precision 546 nm reflectance measurements
- Can be upgraded to full range microspectroscopy
- Can be upgraded to fluorescence microspectroscopy
- The only coal reflectance system that also incorporates color digital imaging.
- Upgrade your old coal reflectance system with supported technology
- Manual or fully automated operation
- Precision temperature control of samples
- Specialized software including statistical analysis, spectral databasing, image analysis and more
- Easy to use and maintain
- From the experts in microspectroscopy
ISO 7404 and ASTM D2798
The CoalPro III™ is designed to measure the reflectance of vitrinite macerals per ISO 7404 and ASTM D2798 standard methods. Offered both in manual and automated mode, the system produces industry standard reports when used with CRAIC Vitrinite Reflectance Standards. Test reports can also be customized to your particular requirements. |
Cutting edge microfluorometry
High resolution color digital imaging
Applications
- Vitrinite Coal Reflectometry
- Organic Petrography
- Kerogen Analysis
- Petroleum Source Rock Analysis
- Petrochemistry
- Reflectance microspectroscopy
- Transmission microspectroscopy
- Fluorescence microspectroscopy
- Color imaging
- Mineralogy analysis
- Gemology
CoalPro III™ For Measuring Vitrinite Reflectance sistemi ile ilgili daha fazla bilgi için tıklayınız.
CRAIC Technology mikrospektrofotometre sistemleri ve uygulamaları ile ilgili daha detaylı bilgi almak için lütfen “www.microspectra.com” sitesini ziyaret ediniz.